The IEEE International Integrated Reliability Workshop (IIRW) took place between 5-9 October 2025 at Stanford Sierra Conference Center, South Lake Tahoe, CA, USA. IIRW focuses on issues that ensures electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems. CMOS and Beyond Team PI Sayani Majumdar was part of the Memory Reliability Expert Forum this year. Also, a contributed talk on “Effect of Thermal Engineering on the Reliability of Analog States in Ferroelectric Hf0.5Zr0.5O2 Memory” was presented from the team.
International Integrated Reliability Workshop (IIRW)
